Speaker : Rohit Nayak
In the semiconductor industry, Design For Testability (DFT) is an essential part of the architecture and design of components. Software designers on the other hand do not pay much (if any) attention to the testing needs of their code.

In this talk we review some core DFT principles like Built-In Self Test, Test Point Insertion, Fault Modeling and Fault Simulation and map them to software testing. Examples of using DFT to create testable software will be given. DFT fits in especially well with the increasing use of Test Automation and Agile Methodologies.

We hope this talk will empower test leads and engineers with knowledge they can use to get their developer counterparts to modify the application-under-test to significantly increase automation, enhance test coverage, run tests faster and reduce the costs of testing.


This session on “Designing For Testability – A Forgotten Design Pattern” will be presented at the 1st IndicThreads.com Conference On Software Quality Assurance and Software Testing to be held in Pune, India on 5,6 March 2010.Click here for a list of other Sessions @ The Conference

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